Nanocrystalline TiNi thin films were produced by cluster beam deposition. A pulsed arc gas aggregation source was used to generate intense and stable supersonic cluster beams. With this technique, films characterized by crystallite sizes of a few tens of nanometers can be obtained without recrystallization by thermal annealing. Films maintain the stoichiometry of the original TiNi alloy. Oxygen contamination is observed.

Synthesis of nanocrystalline TiNi thin films by cluster beam deposition

S Iannotta;
1998

Abstract

Nanocrystalline TiNi thin films were produced by cluster beam deposition. A pulsed arc gas aggregation source was used to generate intense and stable supersonic cluster beams. With this technique, films characterized by crystallite sizes of a few tens of nanometers can be obtained without recrystallization by thermal annealing. Films maintain the stoichiometry of the original TiNi alloy. Oxygen contamination is observed.
1998
Istituto di fotonica e nanotecnologie - IFN
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Inglese
10
6
1023
1031
http://www.sciencedirect.com/science/article/pii/S0965977398001408
Sì, ma tipo non specificato
NI-TI
MEMORY
ALLOYS
1
info:eu-repo/semantics/article
262
E. Barborini ; P. Piseri ; S. Mutti ; P. Milani ; F. Biasioli ; S. Iannotta ; S. Gialanella
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/215658
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