The surface topography of Ag films and surface enhanced Raman scattering (SERS) from benzene on Ag films have been simultaneously recorded. The Ag films were formed by vacuum deposition at temperatures ranging from 100 K to 500 K. Analysis of scanning tunnelling microscopy (STM) images shows that films formed below 250 K are fractal structures with Hausdorff-Besicovitch dimension 2.55 < D < 2.72, while for those formed above 250 K, D?2. The lower temperature, rough films exhibit strong surface enhanced Raman scattering but the higher temperature, smooth films do not. We consider the consequences of fractal character and the possible correlation between this and the SERS activity of these films.
Rough silver films studied by surface enhanced Raman spectroscopy and low temperature scanning tunnelling microscopy
Iannotta;
1995
Abstract
The surface topography of Ag films and surface enhanced Raman scattering (SERS) from benzene on Ag films have been simultaneously recorded. The Ag films were formed by vacuum deposition at temperatures ranging from 100 K to 500 K. Analysis of scanning tunnelling microscopy (STM) images shows that films formed below 250 K are fractal structures with Hausdorff-Besicovitch dimension 2.55 < D < 2.72, while for those formed above 250 K, D?2. The lower temperature, rough films exhibit strong surface enhanced Raman scattering but the higher temperature, smooth films do not. We consider the consequences of fractal character and the possible correlation between this and the SERS activity of these films.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
