The construction of a fast silicon p doped low temperature bolometer is described. It is a 5 × 5 × 0.3 mm Si <100 > n-type chip whose surface has been implanted with p doses of the order of 1018cm-3. The bolometer has a response time better than 1 ?s, a responsivity of 104VW-1 and a NEP of 3x10-12 W(Hz)-1/2.

Fast silicon p doped low temperature bolometer

1984

Abstract

The construction of a fast silicon p doped low temperature bolometer is described. It is a 5 × 5 × 0.3 mm Si <100 > n-type chip whose surface has been implanted with p doses of the order of 1018cm-3. The bolometer has a response time better than 1 ?s, a responsivity of 104VW-1 and a NEP of 3x10-12 W(Hz)-1/2.
1984
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
superconductivity
bolometer
semiconductor
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/215687
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