We introduce balanced-detection Raman-induced Kerr effect microscopy as a new powerful coherent Raman imaging technique, combining background-free detection with the absence of non-resonant background and linear dependence on sample concentration.

Balanced-detection Raman induced Kerr effect microscopy

Manzoni C;Marangoni M;Cerullo;
2012

Abstract

We introduce balanced-detection Raman-induced Kerr effect microscopy as a new powerful coherent Raman imaging technique, combining background-free detection with the absence of non-resonant background and linear dependence on sample concentration.
2012
Inglese
2012 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
Conference on Lasers and Electro-Optics (CLEO)
978-1-55752-933-6
IEEE, 345 E 47TH ST, NY 10017 USA
NEW YORK,
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
MAY 06-11, 2012
San Jose, CA, United States
SCATTERING MICROSCOPY
PULSES
3
none
Kumar V;Casella M;Molotokaite E;Kukura P;Manzoni C;Polli D;Marangoni M;Cerullo; G
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/216576
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