Both organic and inorganic thin film transistors (TFTs) can be fabricated by forming Schottky barrier source/drain contacts. In particular in this work we analyzed the staggered configuration of Schottky barrier transistors and discussed three different cases, including organic, a-Si:H and InGaZnO TFTs. Device characteristics of these devices are seriously influenced by contact effects, with the parasitic voltage drops at the contacts reducing the effective voltages applied to the channel of the transistor. A simple method to extract the contact I-V characteristics is presented and, by using two-dimensional numerical simulations, the contact effects have been analyzed in great detail.

Contact Effects in Organic and Inorganic Thin Film Transistors

Fortunato;Guglielmo;Rapisarda;Matteo;Valletta;Antonio;Mariucci;Luigi
2013

Abstract

Both organic and inorganic thin film transistors (TFTs) can be fabricated by forming Schottky barrier source/drain contacts. In particular in this work we analyzed the staggered configuration of Schottky barrier transistors and discussed three different cases, including organic, a-Si:H and InGaZnO TFTs. Device characteristics of these devices are seriously influenced by contact effects, with the parasitic voltage drops at the contacts reducing the effective voltages applied to the channel of the transistor. A simple method to extract the contact I-V characteristics is presented and, by using two-dimensional numerical simulations, the contact effects have been analyzed in great detail.
2013
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
Circuits and Thin Film Transistors, ULSI vs TFT 4
54
171
185
July 8-11, 2013
Grenoble, France
8
none
Fortunato, Guglielmo; Fortunato, Guglielmo; Rapisarda, Matteo; Rapisarda, Matteo; Valletta, Antonio; Valletta, Antonio; Mariucci, Luigi; Mariucci, Lui...espandi
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
   Complementary Organic Semiconductor and Metal Integrated Circuits
   COSMIC
   FP7
   247681
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/217316
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