Polycrystalline samples and thin films of the x=0.8 member of the CexGd1-xO2-y solid solution have been successfully prepared. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements as a function of preparation route, grain size, substrate nature and film thickness. Our data shows that the substrate roughness plays a relevant role in affecting the final sigma; however, by optimizing the thin films preparation conditions we showed that the conductivity of CGO material is always greater than that of the state-of-the-art oxide conductor, the YSZ 8 mol%, even though an electronic contribution ranging from 10% to 20% was found.
Synthesis and characterization of Ce0.8Gd0.2O2-y polycrystalline and thin film materials
Chiodelli G;Malavasi L;Mustarelli P;
2005
Abstract
Polycrystalline samples and thin films of the x=0.8 member of the CexGd1-xO2-y solid solution have been successfully prepared. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements as a function of preparation route, grain size, substrate nature and film thickness. Our data shows that the substrate roughness plays a relevant role in affecting the final sigma; however, by optimizing the thin films preparation conditions we showed that the conductivity of CGO material is always greater than that of the state-of-the-art oxide conductor, the YSZ 8 mol%, even though an electronic contribution ranging from 10% to 20% was found.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
