The performances of metal-semiconductor point-contact diodes as mixers in the near-infrared region were tested. Preliminary experiments were performed in order to phase-lock two diode lasers at 850 nm a few hundred gigahertz apart. GaSb, InAs, and InSb as semiconductor layers were used. The frequency bridge between the two lasers was covered by a Gunn diode frequency locked to a 1-GHz oscillator. A novel phase-lock circuit was tested on two diode lasers 72 GHz apart.

Measurements of near-infrared frequency mixing by metal-semiconductor point-contact diodes

Galzerano G;
2005

Abstract

The performances of metal-semiconductor point-contact diodes as mixers in the near-infrared region were tested. Preliminary experiments were performed in order to phase-lock two diode lasers at 850 nm a few hundred gigahertz apart. GaSb, InAs, and InSb as semiconductor layers were used. The frequency bridge between the two lasers was covered by a Gunn diode frequency locked to a 1-GHz oscillator. A novel phase-lock circuit was tested on two diode lasers 72 GHz apart.
2005
Istituto di fotonica e nanotecnologie - IFN
Inglese
54
4
1407
1411
5
Sì, ma tipo non specificato
diode laser
frequency measurement
near-infrared
optical mixer
phase-lock
VISIBLE LASER-LIGHT
1
info:eu-repo/semantics/article
262
Bava E;Beverini N;Carelli G;De Michele A;Galzerano G;Maccioni E;Moretti A;Prevedelli M;Sorrentino F;Svelto; C
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/219657
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