Precise measurements of the surface impedance Z(s) = R-s + iX(s) of Bi2Sr2CaCu2O8+x superconducting films as a function of temperature and r.f. magnetic field are reported. The samples are grown by Liquid-Phase-Epitaxy (LPE) on LaAlO3 and Th:LaAlO3 (100) substrates. The measurements are performed by a meander-line microstrip resonator operating at 2 GHz. All the samples show high residual losses (R-s = 0.4 m Ohm at T = 4.2 K). The temperature dependence of the ab-plane penetration depth has a quadratic behavior at low temperatures. The microwave power dependence of the surface impedance shows evidence of vortex penetration in weak links inside the films.
Microwave surface impedance measurements of epitaxial Bi2Sr2CaCu2O8+x films grown by LPE
Aruta C;
1997
Abstract
Precise measurements of the surface impedance Z(s) = R-s + iX(s) of Bi2Sr2CaCu2O8+x superconducting films as a function of temperature and r.f. magnetic field are reported. The samples are grown by Liquid-Phase-Epitaxy (LPE) on LaAlO3 and Th:LaAlO3 (100) substrates. The measurements are performed by a meander-line microstrip resonator operating at 2 GHz. All the samples show high residual losses (R-s = 0.4 m Ohm at T = 4.2 K). The temperature dependence of the ab-plane penetration depth has a quadratic behavior at low temperatures. The microwave power dependence of the surface impedance shows evidence of vortex penetration in weak links inside the films.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
