The oxidation of a Cu-Cd thin film obtained by coevaporation of the two metals has been studied by XPS. The oxygen is initially adsorbed on the alloy surface, afterwards the Cd component is oxidized to CdO, while the Cu component remains unchanged also at high exposure of O2 (6 × 108 L). The Cu/Cd atomic ratio decreases during the oxidation reaction, in agreement with the formation of a CdO layer onto the alloy surface. The thickness of the oxidized layer has been quantified as a function of O2 exposure. © 1991.

XPS study of the oxidation of a Cu-Cd thin film

G Contini;
1991

Abstract

The oxidation of a Cu-Cd thin film obtained by coevaporation of the two metals has been studied by XPS. The oxygen is initially adsorbed on the alloy surface, afterwards the Cd component is oxidized to CdO, while the Cu component remains unchanged also at high exposure of O2 (6 × 108 L). The Cu/Cd atomic ratio decreases during the oxidation reaction, in agreement with the formation of a CdO layer onto the alloy surface. The thickness of the oxidized layer has been quantified as a function of O2 exposure. © 1991.
1991
Inglese
251-252
C
814
818
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Sì, ma tipo non specificato
Metallic Films - Surface Properties
Spectroscopy
Electron
Surfaces - Spectroscopic Analysis
Cadmium Oxides
X-Ray Photoelectron Spectra
Copper Cadmium Alloys
cited By (since 1996)1
4
info:eu-repo/semantics/article
262
Castro, Di; Polzonetti, V; Contini, G; G,
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/220542
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