Magnetic, micromagnetic, and texture properties of the martensitic thin films prepared by magnetron sputtering of Ni-49.5 Mn-28 Ga-22.5 target on MgO(100) wafer are studied as a function of film thickness. The films exhibit 220-fiber texture. Moreover, in contrast to thick films, a considerable in-plane texture component is giving rise to the pronounced in-plane magnetic anisotropy found in the thin film. The texture features together with a large magnetocrystalline anisotropy lead to the particular domain structure and different magnetic anisotropy components of films depending on the film thickness and substrate nature.

MFM Domain Imaging of Textured Ni-Mn-Ga/MgO(100) Thin Films.

Besseghini S;
2008

Abstract

Magnetic, micromagnetic, and texture properties of the martensitic thin films prepared by magnetron sputtering of Ni-49.5 Mn-28 Ga-22.5 target on MgO(100) wafer are studied as a function of film thickness. The films exhibit 220-fiber texture. Moreover, in contrast to thick films, a considerable in-plane texture component is giving rise to the pronounced in-plane magnetic anisotropy found in the thin film. The texture features together with a large magnetocrystalline anisotropy lead to the particular domain structure and different magnetic anisotropy components of films depending on the film thickness and substrate nature.
2008
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/22075
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