Combining reflection high-energy electron diffraction, high-resolution transmission electron microscopy, and high-angle annular dark field scanning transmission electron microscopy we unveil the existence of a peculiar transition from a three-dimensional to a two-dimensional growth mode in anatase TiO2/LaAlO3 heterostructures. Such a growth dynamics is accompanied by Al interdiffusion from substrate to the growing film up to a critical thickness of 20 nm. With the extra support of ab initio calculations, we show that the crossover between the two growth modes corresponds to the formation of two distinct regions characterized by (103)- and (101)-oriented crystallographic shear superstructures, occurring in the upmost film region and in proximity of the film/substrate interface, respectively. © 2013 Springer Science+Business Media Dordrecht.

Evolution of nanostructures of anatase TiO2 thin films grown on (001) LaAlO3

Regina Ciancio;Andrea Vittadini;Carmela Aruta;Fabio Miletto Granozio;Umberto Scotti di Uccio;Elvio Carlino
2013

Abstract

Combining reflection high-energy electron diffraction, high-resolution transmission electron microscopy, and high-angle annular dark field scanning transmission electron microscopy we unveil the existence of a peculiar transition from a three-dimensional to a two-dimensional growth mode in anatase TiO2/LaAlO3 heterostructures. Such a growth dynamics is accompanied by Al interdiffusion from substrate to the growing film up to a critical thickness of 20 nm. With the extra support of ab initio calculations, we show that the crossover between the two growth modes corresponds to the formation of two distinct regions characterized by (103)- and (101)-oriented crystallographic shear superstructures, occurring in the upmost film region and in proximity of the film/substrate interface, respectively. © 2013 Springer Science+Business Media Dordrecht.
2013
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
Istituto Officina dei Materiali - IOM -
Ab initio calculations
Crystallographic shears
Defects and impurities
Film/substrate interface
Gradient and other corrections
High-angle annular dark fields
Thin-film structure
Two-dimensional growth
Chemical analysis
Density functional theory
Film growth
Interfaces (materials)
Lanthanum alloys
Local density approximation
Segregation (metallography)
Transmission electron microscopy
Titanium dioxide
aluminum
lanthanum
nanofilm
titanium dioxide
ab initio calculation
article
crystal structure
diffusion
film
molecular dynamics
particle size
phase transition
priority journal
scanning transmission electron microscopy
thickness
transmission electron microscopy
X ray diffraction
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/220767
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