Structural properties of [BaCuOx](2)/[CaCuO2](n) superconducting superlattices with a number of CaCuO2 layers ranging between 2 and 3 were investigated using synchrotron radiation, by coplanar (symmetrical and asymmetrical) X-ray diffraction and also in grazing incidence,geometry. This extensive X-ray diffraction characterisation allowed to confirm the pseudomorphic growth of [BaCuOx](2)/[CaCuO2](n) superlattices on the SrTiO3 (001)-oriented substrate. Reciprocal space maps in symmetrical configuration, i.e. by specular reflection, showed the effect of a slight miscut of the substrate on the inclination of the rods. Finally, the interface and surface morphology were investigated by diffuse scattering obtaining the in-plane and out-of-plane correlation properties of the interface roughness and these results were compared with the surface roughness measured by atomic force microscopy.

Structure of superconducting [BaCuOx]2/[CaCuO2]n superlattices on SrTiO3(001) investigated by X-ray scattering

Aruta C;
2001

Abstract

Structural properties of [BaCuOx](2)/[CaCuO2](n) superconducting superlattices with a number of CaCuO2 layers ranging between 2 and 3 were investigated using synchrotron radiation, by coplanar (symmetrical and asymmetrical) X-ray diffraction and also in grazing incidence,geometry. This extensive X-ray diffraction characterisation allowed to confirm the pseudomorphic growth of [BaCuOx](2)/[CaCuO2](n) superlattices on the SrTiO3 (001)-oriented substrate. Reciprocal space maps in symmetrical configuration, i.e. by specular reflection, showed the effect of a slight miscut of the substrate on the inclination of the rods. Finally, the interface and surface morphology were investigated by diffuse scattering obtaining the in-plane and out-of-plane correlation properties of the interface roughness and these results were compared with the surface roughness measured by atomic force microscopy.
2001
Atomic force microscopy
Interfaces (materials)
Superconducting materials
Surface roughness
X ray diffraction analysis
X ray scattering
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/220831
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