Structural properties of [BaCuOx](2)/[CaCuO2](n) superconducting superlattices with a number of CaCuO2 layers ranging between 2 and 3 were investigated using synchrotron radiation, by coplanar (symmetrical and asymmetrical) X-ray diffraction and also in grazing incidence,geometry. This extensive X-ray diffraction characterisation allowed to confirm the pseudomorphic growth of [BaCuOx](2)/[CaCuO2](n) superlattices on the SrTiO3 (001)-oriented substrate. Reciprocal space maps in symmetrical configuration, i.e. by specular reflection, showed the effect of a slight miscut of the substrate on the inclination of the rods. Finally, the interface and surface morphology were investigated by diffuse scattering obtaining the in-plane and out-of-plane correlation properties of the interface roughness and these results were compared with the surface roughness measured by atomic force microscopy.

Structure of superconducting [BaCuOx]2/[CaCuO2]n superlattices on SrTiO3(001) investigated by X-ray scattering

Aruta C;
2001

Abstract

Structural properties of [BaCuOx](2)/[CaCuO2](n) superconducting superlattices with a number of CaCuO2 layers ranging between 2 and 3 were investigated using synchrotron radiation, by coplanar (symmetrical and asymmetrical) X-ray diffraction and also in grazing incidence,geometry. This extensive X-ray diffraction characterisation allowed to confirm the pseudomorphic growth of [BaCuOx](2)/[CaCuO2](n) superlattices on the SrTiO3 (001)-oriented substrate. Reciprocal space maps in symmetrical configuration, i.e. by specular reflection, showed the effect of a slight miscut of the substrate on the inclination of the rods. Finally, the interface and surface morphology were investigated by diffuse scattering obtaining the in-plane and out-of-plane correlation properties of the interface roughness and these results were compared with the surface roughness measured by atomic force microscopy.
2001
Inglese
183
2
353
364
http://www.scopus.com/inward/record.url?eid=2-s2.0-0035249320&partnerID=40&md5=bf514b77280db8c899c2ad23617cb2ea
Sì, ma tipo non specificato
Atomic force microscopy
Interfaces (materials)
Superconducting materials
Surface roughness
X ray diffraction analysis
X ray scattering
1
info:eu-repo/semantics/article
262
Aruta C;Zegenhagen J;Cowie B;Balestrino G;Pasquini G;Medaglia; P G;Ricci F;Luebbert D;Baumbach T;Riedo E;Ortega L;Kremer R;Albrecht; J
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/220831
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