Transmission electron microscopy (TEM) provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.
TEM for Characterization of Semiconductor Nanomaterials
Elvio Carlino
2014
Abstract
Transmission electron microscopy (TEM) provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.File in questo prodotto:
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