The use of surface plasmon resonance as a powerful tool for the nonlinear characterization of ultrathin dielectric layers is investigated and experimentally demonstrated. The off-resonant intensity dependent refractive index of 10-200nm thick films of soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadyine deposited upon silver was measured at 1064nm and with picosecond pulses.
Nonlinear Characterization of Nanometer-thick Dielectric Layers by Surface Plasmon Resonance Techniques
Toci G
2003
Abstract
The use of surface plasmon resonance as a powerful tool for the nonlinear characterization of ultrathin dielectric layers is investigated and experimentally demonstrated. The off-resonant intensity dependent refractive index of 10-200nm thick films of soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadyine deposited upon silver was measured at 1064nm and with picosecond pulses.File in questo prodotto:
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