This paper reports on the optical properties of Erbium-doped zinctellurite (TeO2ZnCl2ZnO) oxyhalide glass waveguides, deposited by reactive pulsed laser deposition (RPLD) on silica substrates. Er3+-doped zinctellurite glass (ZT) targets were ablated in oxygen dynamical flow at two different pressure values of 5 and 10 Pa by ArF excimer laser at the fluence of 3.7 J/cm 2 . The waveguiding properties of the deposited films were investigated by the m-line technique. The TE0 mode excitation was used for photoluminescence (PL) and Raman measurements, in order to study the Erbium ion 4I13/2 ® 4I15/2 transition and structural properties of the deposited films, respectively. Optical band gap and wavelength dependence of the real and imaginary parts of the refractive index were estimated from transmission spectra
Er3+-doped tellurite waveguides deposited by excimer laser ablation
Ferrari M;
2003
Abstract
This paper reports on the optical properties of Erbium-doped zinctellurite (TeO2ZnCl2ZnO) oxyhalide glass waveguides, deposited by reactive pulsed laser deposition (RPLD) on silica substrates. Er3+-doped zinctellurite glass (ZT) targets were ablated in oxygen dynamical flow at two different pressure values of 5 and 10 Pa by ArF excimer laser at the fluence of 3.7 J/cm 2 . The waveguiding properties of the deposited films were investigated by the m-line technique. The TE0 mode excitation was used for photoluminescence (PL) and Raman measurements, in order to study the Erbium ion 4I13/2 ® 4I15/2 transition and structural properties of the deposited films, respectively. Optical band gap and wavelength dependence of the real and imaginary parts of the refractive index were estimated from transmission spectraI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
