We present expressions for the resonant magnetic X-ray scattering (XRMS) by surfaces possessing roughness and analyze both the structural and magnetic roughness of a surface, as well as their correlation. We demonstrate that the leading contribution to the difference (DI) in the diffuse scattering between left- and right-circularly polarized light for a rough surface vanishes unless the structural and magnetic roughnesses are correlated, to leading order in the magnetization. The effects of magnetic domain structure and magnetic dead layers on the surface scattering are also discussed.

Resonant magnetic scattering of polarized x-rays at the Mn 2p edge from Mn0.06Ge0.94 diluted magnetic semiconductor

Perfetti P;Quaresima C;Zema N;Grazioli C;Testa AM;Fiorani D;Olivieri B;
2008

Abstract

We present expressions for the resonant magnetic X-ray scattering (XRMS) by surfaces possessing roughness and analyze both the structural and magnetic roughness of a surface, as well as their correlation. We demonstrate that the leading contribution to the difference (DI) in the diffuse scattering between left- and right-circularly polarized light for a rough surface vanishes unless the structural and magnetic roughnesses are correlated, to leading order in the magnetization. The effects of magnetic domain structure and magnetic dead layers on the surface scattering are also discussed.
2008
Istituto di Scienze dell'Atmosfera e del Clima - ISAC
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/23484
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