The investigation on the interface properties of fcc-CoPt/CoO thin films grown by Pulsed Laser Deposition is presented. The structural and microstructural properties of the CoO antiferromagnetic layer have been modulated by thermal treatments in order to investigate their influence on the magnetic behavior of the system.
Exchange Bias in fcc-CoPt/CoO/Si films as a function of annealing treatment
Laureti S;Agostinelli E;Fiorani D;Testa AM;Varvaro G;Generosi A;Paci B;
2009
Abstract
The investigation on the interface properties of fcc-CoPt/CoO thin films grown by Pulsed Laser Deposition is presented. The structural and microstructural properties of the CoO antiferromagnetic layer have been modulated by thermal treatments in order to investigate their influence on the magnetic behavior of the system.File in questo prodotto:
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