The Energy Dispersive X-ray Diffraction (EDXD) proved to be an interesting alternative to its conventional Angular Dispersive counterpart (ADXD) each time the in situ measurements are of concern. Indeed, although its resolution is lower than that of ADXD, nevertheless it may allow a very accurate determination of even minimal changes of crystalline powders lattice parameters, thanks to several advantages it exhibits with respect to ADXD. Among these advantages, discussed in the paper, the main is that no motion is required upon diffraction pattern collection. However, the reliability of EDXD results may be compromised by the presence of an electronic noise that, along with a broadening of the Bragg peaks, may induce a shift of their positions. To evaluate the magnitude of such shift and, therefore, the level of confidence in determining the lattice parameters, a systematic study of the disturbance due to the electronic noise is reported.

Effect of disturbance induced by the electronic noise on the Energy Dispersive X-ray Diffraction patterns collection

Fosca M;
2009

Abstract

The Energy Dispersive X-ray Diffraction (EDXD) proved to be an interesting alternative to its conventional Angular Dispersive counterpart (ADXD) each time the in situ measurements are of concern. Indeed, although its resolution is lower than that of ADXD, nevertheless it may allow a very accurate determination of even minimal changes of crystalline powders lattice parameters, thanks to several advantages it exhibits with respect to ADXD. Among these advantages, discussed in the paper, the main is that no motion is required upon diffraction pattern collection. However, the reliability of EDXD results may be compromised by the presence of an electronic noise that, along with a broadening of the Bragg peaks, may induce a shift of their positions. To evaluate the magnitude of such shift and, therefore, the level of confidence in determining the lattice parameters, a systematic study of the disturbance due to the electronic noise is reported.
2009
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/23518
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