The present study, reporting time-resolved investigations of polymer-based films for plastic photovoltaics, particularly focuses on aging related to the devices interface properties. The unconventional approach used is based on an in situ cross-monitoring of the films structural/morphological properties. For this propose, Energy Dispersive X-ray Reflectivity and Diffraction techniques were used in synergy with atomic force microscopy analysis. In this way, the meso-scale modifications of the organic film bulk, surface and buried interface with the electrode, were observed directly. As a result of such non-destructive characterization, access to the concomitant chemicalphysical processes, occurring to the cell active component during illumination and related to degradation and reliability issues, is gained.
Discriminating bulk, surface and interface aging effects in polymer-based active materials for efficient photovoltaic devices
Paci B;Generosi A;
2010
Abstract
The present study, reporting time-resolved investigations of polymer-based films for plastic photovoltaics, particularly focuses on aging related to the devices interface properties. The unconventional approach used is based on an in situ cross-monitoring of the films structural/morphological properties. For this propose, Energy Dispersive X-ray Reflectivity and Diffraction techniques were used in synergy with atomic force microscopy analysis. In this way, the meso-scale modifications of the organic film bulk, surface and buried interface with the electrode, were observed directly. As a result of such non-destructive characterization, access to the concomitant chemicalphysical processes, occurring to the cell active component during illumination and related to degradation and reliability issues, is gained.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
