Thin films of ferroelectric relaxor Pb1 - 3x/2LaxZr0.2Ti0.8O3, x = 0.22 have been integrated in an oxidic heterostructure for electro-optical investigations. The quadratic electro-optic behavior and optical properties have been studied by means of variable angle spectroscopic ellipsometry method in reflection mode. Birefringence values up to ?? = 0.17° have been obtained for quadratic compositions at ? = 540 nm and 65° angle of incidence. Structural, chemical and morphologic properties of Pb1-3x/2LaxZr0.2Ti0.8O3 (x = 0.22) thin films have been investigated by x-ray diffraction and atomic force microscopy techniques. The dielectric and ferroelectric behavior has been investigated using dielectric spectroscopy and a ferroelectric test system.
Electrical and optical investigations on Pb1-3x/2LaxZr0.2Ti0.8O3 thin films obtained by radiofrequency assisted pulsed laser deposition
Craciun F;Galassi C;
2012
Abstract
Thin films of ferroelectric relaxor Pb1 - 3x/2LaxZr0.2Ti0.8O3, x = 0.22 have been integrated in an oxidic heterostructure for electro-optical investigations. The quadratic electro-optic behavior and optical properties have been studied by means of variable angle spectroscopic ellipsometry method in reflection mode. Birefringence values up to ?? = 0.17° have been obtained for quadratic compositions at ? = 540 nm and 65° angle of incidence. Structural, chemical and morphologic properties of Pb1-3x/2LaxZr0.2Ti0.8O3 (x = 0.22) thin films have been investigated by x-ray diffraction and atomic force microscopy techniques. The dielectric and ferroelectric behavior has been investigated using dielectric spectroscopy and a ferroelectric test system.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
