Optical properties of quasicrystalline Al-Pd-Re films have been investigated in the mid and far IR regions. Films were deposited on sapphire substrates using layer-by-layer ion-plasma sputtering with subsequent vacuum annealing. Reflection spectra have been measured in a wide IR spectral range from 50 to 7500 cm -1. The complex dielectric function of the films was determined from the experimental data by dispersion analysis of the reflection spectra. The frequency dependence of the real part of the optical conductivity was calculated.

Reflection spectra and optical constants of quasicrystalline Al-Pd-Re films in the IR region

G Mattei;
2007

Abstract

Optical properties of quasicrystalline Al-Pd-Re films have been investigated in the mid and far IR regions. Films were deposited on sapphire substrates using layer-by-layer ion-plasma sputtering with subsequent vacuum annealing. Reflection spectra have been measured in a wide IR spectral range from 50 to 7500 cm -1. The complex dielectric function of the films was determined from the experimental data by dispersion analysis of the reflection spectra. The frequency dependence of the real part of the optical conductivity was calculated.
2007
Istituto dei Sistemi Complessi - ISC
Inglese
Russo
52
6
1036
1039
http://link.springer.com/article/10.1134%2FS106377450706017X
Sì, ma tipo non specificato
Original Russian Text: V.A. Yakovlev, N.N. Novikova, G. Mattei, A.A. Teplov, D.C. Shaitura, D.I. Dolgii, E.D. Ol'shanski, 2007, published in Kristallografiya, 2007, Vol. 52, No. 6, pp. 1073-1076.
7
info:eu-repo/semantics/article
262
Yakovle, Va; Novikova, Nn; Mattei, G; Teplov, Aa; Shaitura, Dc; Dolgii, Di; Ol'Shanskii, Ed
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/237237
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