A novel approach for the characterization of coupled transmission lines fabricated on thin dielectric membranes is presented. The method is based on the frequency dependence of the S-parameters of the structure obtained through electromagnetic simulations. As an application of this method results about microstrip coupled lines are presented
Characterization of Coupled Lines manufactured on Thin Dielectric Membranes using Electromagnetic Simulations
R Marcelli;G Bartolucci;
2000-01-01
Abstract
A novel approach for the characterization of coupled transmission lines fabricated on thin dielectric membranes is presented. The method is based on the frequency dependence of the S-parameters of the structure obtained through electromagnetic simulations. As an application of this method results about microstrip coupled lines are presentedFile in questo prodotto:
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