The High Resolution X-Ray Diffraction technique in the reciprocal space mapping mode is exploited to study sub-micron periodic domain structures in lithium niobate crystals. Periodic satellite structure were detected around the reciprocal lattice points which carry information on the domain period and shape and also on the presence of lattice deformations. Moreover a pronounced diffuse scattering peak was observed, indicating the presence of a random displacement field possibly associated to the presence of randomly distributed structural defect.
High resolution X-ray characterization of sub-micron periodic domain structures in lithium niobate crystals
Grilli S;Ferraro P;De Natale P;Sansone L
2007
Abstract
The High Resolution X-Ray Diffraction technique in the reciprocal space mapping mode is exploited to study sub-micron periodic domain structures in lithium niobate crystals. Periodic satellite structure were detected around the reciprocal lattice points which carry information on the domain period and shape and also on the presence of lattice deformations. Moreover a pronounced diffuse scattering peak was observed, indicating the presence of a random displacement field possibly associated to the presence of randomly distributed structural defect.File in questo prodotto:
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