The crystal structure of fluoborite [Mg3F3(BO3)] was refined by Dal Negro and Tadini (1974) who provided a complete structural model. Previously, Takeuchi (1950) had refined an OH-dominant fluoborite (OH similar to 70%), but the limited quantity of data (extracted from two Weissenberg-Buerger photographs) did not permit the location of H atoms. Dal Negro and Tadini (1974) also could not locate H atoms because they used a crystal with near end-member composition. We have located the H bond in an OH-dominant fluoborite fi om the Betic Cordilleras (SE Spain). Excellent quality X-ray data on two crystals of fluoborite allowed discovery and refinement of the H position in this mineral. Electron microprobe (EMP) and secondary-ion mass spectrometry (SIMS) analyses of the light elements H, B, and F have resulted in the formulation of special procedures to obtain accurate, high quality quantitative data, which are presented in this paper. EMP, SIMS, and crystal structure refinement (SREF) data are in a good agreement. Linear equations are also presented to calculate the F content directly from cell parameters.
New data on the crystal-chemistry of fluoborite by means of SREF, SIMS, and EMP analysis
Ottolini L
2000
Abstract
The crystal structure of fluoborite [Mg3F3(BO3)] was refined by Dal Negro and Tadini (1974) who provided a complete structural model. Previously, Takeuchi (1950) had refined an OH-dominant fluoborite (OH similar to 70%), but the limited quantity of data (extracted from two Weissenberg-Buerger photographs) did not permit the location of H atoms. Dal Negro and Tadini (1974) also could not locate H atoms because they used a crystal with near end-member composition. We have located the H bond in an OH-dominant fluoborite fi om the Betic Cordilleras (SE Spain). Excellent quality X-ray data on two crystals of fluoborite allowed discovery and refinement of the H position in this mineral. Electron microprobe (EMP) and secondary-ion mass spectrometry (SIMS) analyses of the light elements H, B, and F have resulted in the formulation of special procedures to obtain accurate, high quality quantitative data, which are presented in this paper. EMP, SIMS, and crystal structure refinement (SREF) data are in a good agreement. Linear equations are also presented to calculate the F content directly from cell parameters.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
