We present a method for evaluating the spatial inhomogeneity of adsorbate-induced band bending on semiconductors from the substrate core-level lineshape. As a case study we consider the first stages of accumulation layer formation due to K adsorption on the H:Si(111) surface at 300 K. The observed Si 2p core-level lineshape variation is accounted for considering each randomly distributed adatom as a source of a screened Coulomb potential. We determine the coverage dependence of the band-bending distribution, and the parameters characterizing the local K-induced potential.

Evaluation of alkali-induced band-bending inhomogeneity and charge transfer trend from core-level analysis

Pedio M;Larciprete;
2000

Abstract

We present a method for evaluating the spatial inhomogeneity of adsorbate-induced band bending on semiconductors from the substrate core-level lineshape. As a case study we consider the first stages of accumulation layer formation due to K adsorption on the H:Si(111) surface at 300 K. The observed Si 2p core-level lineshape variation is accounted for considering each randomly distributed adatom as a source of a screened Coulomb potential. We determine the coverage dependence of the band-bending distribution, and the parameters characterizing the local K-induced potential.
2000
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
alkali
potassium
silicon
adsorption
article
energy transfer
semiconductor
surface property
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/243774
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