We investigate the finite frequency (FF) noise properties of edge states in the quantum Hall regime. We consider the measurement scheme of a resonant detector coupled to a quantum point contact in the weak-backscattering limit. A detailed analysis of the difference between the 'measured' noise, due to the presence of the resonant detector, and the symmetrized FF noise is presented. We discuss both the Laughlin and Jain sequences, studying the tunnelling excitations in these hierarchical models. We argue that the measured noise can better distinguish between the different excitations in the tunnelling process with respect to the symmetrized FF counterpart in an experimentally relevant range of parameters. Finally, we illustrate the effect of the detector temperature on the sensibility of this measure. © 2014 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft.

Multiple quasiparticle hall spectroscopy investigated with a resonant detector

Carrega M;Braggio A;Sassetti M
2014

Abstract

We investigate the finite frequency (FF) noise properties of edge states in the quantum Hall regime. We consider the measurement scheme of a resonant detector coupled to a quantum point contact in the weak-backscattering limit. A detailed analysis of the difference between the 'measured' noise, due to the presence of the resonant detector, and the symmetrized FF noise is presented. We discuss both the Laughlin and Jain sequences, studying the tunnelling excitations in these hierarchical models. We argue that the measured noise can better distinguish between the different excitations in the tunnelling process with respect to the symmetrized FF counterpart in an experimentally relevant range of parameters. Finally, we illustrate the effect of the detector temperature on the sensibility of this measure. © 2014 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft.
2014
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
Istituto Nanoscienze - NANO
Finite frequency noise
Fractionally charged excitations
Quantum Hall effect
Transport properties
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/247079
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