The evaluation of uncertainty in temperature-dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K-edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest-neighbours parameters: bond thermal expansion, parallel and perpendicular mean-square relative displacements and the third cumulant. Different causes of uncertainty, a comparison of experimental results with theoretical models, the difference between EXAFS and crystallographic thermal expansions and the meaning of the third cumulant are discussed.

Accuracy evaluation in temperature-dependent EXAFS measurements of CdTe

F Rocca;
2013

Abstract

The evaluation of uncertainty in temperature-dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K-edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest-neighbours parameters: bond thermal expansion, parallel and perpendicular mean-square relative displacements and the third cumulant. Different causes of uncertainty, a comparison of experimental results with theoretical models, the difference between EXAFS and crystallographic thermal expansions and the meaning of the third cumulant are discussed.
2013
Istituto di fotonica e nanotecnologie - IFN
Istituto di fotonica e nanotecnologie - IFN
Debye model
Einstein model
EXAFS
mean-square relative displacements
thermal expansion
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/249997
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