The theory for so-called Time-Delayed-Measurements is outlined. This method allows for isothermal annealing studies in emission Mössbauer spectroscopy utilizing radioactive beams. The usefulness of this method is illustrated by the example of the annealing of a magnetic defect in ZnO.

Isothermal defect annealing in semiconductors investigated by time-delayed Mössbauer spectroscopy: application to ZnO

R Mantovan;
2009

Abstract

The theory for so-called Time-Delayed-Measurements is outlined. This method allows for isothermal annealing studies in emission Mössbauer spectroscopy utilizing radioactive beams. The usefulness of this method is illustrated by the example of the annealing of a magnetic defect in ZnO.
2009
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/250696
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