A study of the structure and transport properties of highly textured, epitaxial oriented BaZr0.8Y0.2O3-x thin films grown on NdGaO3(110) is reported. Films have been grown by pulsed laser deposition and their conductivity studied as a function of temperature and thickness. The results show an increased conductance as the sample thickness decreases. The measured conductivity corresponding to an in-plane conductivity of 20 S cm-1 has been systematically observed in the range of 550-600 °C for several 10 nm-thick films. The high values of conductivity are possibly related to the high densities of defects, mostly dislocations at the interface of the film with the substrate
Heavily strained BaZr0.8Y0.2O3-x interfaces with enhanced transport properties
Vittorio Foglietti;Antonello Tebano;Carmela Aruta;Giuseppe Balestrino
2014
Abstract
A study of the structure and transport properties of highly textured, epitaxial oriented BaZr0.8Y0.2O3-x thin films grown on NdGaO3(110) is reported. Films have been grown by pulsed laser deposition and their conductivity studied as a function of temperature and thickness. The results show an increased conductance as the sample thickness decreases. The measured conductivity corresponding to an in-plane conductivity of 20 S cm-1 has been systematically observed in the range of 550-600 °C for several 10 nm-thick films. The high values of conductivity are possibly related to the high densities of defects, mostly dislocations at the interface of the film with the substrateI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
