M/Semi-insulating (SI) GaAs/M diodes with novel Mg-based metallization are investigated using current-voltage measurement, ?-particle and photon detection. An anomalous decrease of the reverse current and peculiar photon spectra has been observed with such contact explainable by a strong electron accumulation due to the creation of a quasi-degenerate region at the Mg/SI-GaAs interface.

M/Si-GaAs/M diode: Role of the metal contact in electrical transport, a-particle and photon detection

Gombia E;
2014

Abstract

M/Semi-insulating (SI) GaAs/M diodes with novel Mg-based metallization are investigated using current-voltage measurement, ?-particle and photon detection. An anomalous decrease of the reverse current and peculiar photon spectra has been observed with such contact explainable by a strong electron accumulation due to the creation of a quasi-degenerate region at the Mg/SI-GaAs interface.
2014
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Inglese
Breza J., Donoval D., Vavrinski E.
Tenth International Conference on Advanced Semiconductor Devices and Microsystems
Tenth International Conference on Advanced Semiconductor Devices and Microsystems
49
52
4
http://www.scopus.com/inward/record.url?eid=2-s2.0-84921754582&partnerID=q2rCbXpz
IEEE-Institute Of Electrical And Electronics Engineers Inc.
Piscataway
STATI UNITI D'AMERICA
No
20-22 Ottobre 2014
Smolenice, Slovakia
1
none
Dubecky F.; Zat'Ko B.; Vanko G.; Hubik P.; Oswald J.; Kindl D.; Gombia E.; Kovac J.; Sagatova A.; Necas V.
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/254291
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