A numerical analysis founded on the analog circuit model is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the Photothermal Deflection Method. Experimental results are also discussed.
Numerical Analisys of Nonhomogeneous Media Through Photothermal Deflection
G de Portu
1994
Abstract
A numerical analysis founded on the analog circuit model is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the Photothermal Deflection Method. Experimental results are also discussed.File in questo prodotto:
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