Thick epitaxial multilayer silicene films with a ?3 × ?3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.
24 h stability of thick multilayer silicene in air
Paola De Padova;Carlo Ottaviani;Claudio Quaresima;Bruno Olivieri;Patrizia Imperatori;Amanda Generosi;Barbara Paci;
2014
Abstract
Thick epitaxial multilayer silicene films with a ?3 × ?3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.File in questo prodotto:
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