In this study we modified and optimized a technique using an ordinary spin-coater device to deposit lipids on chemically etched silicon substrates. Tapping-mode atomic force microscopy is used for sample characterization, thereby realizing non destructive characterization with nanometrical resolution.
Optimization of spin-coating-based technique to realize solid-supported lipid multilayers
Girasole M;Cricenti A;Flamini A;Prosperi T;
2006
Abstract
In this study we modified and optimized a technique using an ordinary spin-coater device to deposit lipids on chemically etched silicon substrates. Tapping-mode atomic force microscopy is used for sample characterization, thereby realizing non destructive characterization with nanometrical resolution.File in questo prodotto:
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