The challenge for the commercialization of YBCO Coated Conductors (CC) is the development of a low cost manufacturing process to allow for a cheap, fast and continuous deposition of superconducting coatings with high electrical performance. We are currently investigating 2 ways to reduce the CC production costs: i) reducing the complexity of the CC architecture, by growing a single buffer layer based on doped CeO2, and ii) utilizing a new reel-to-reel apparatus for long length CC processing, equipped with a cheap and reliable deposition system (PED, Pulsed Electron Deposition). In this work we report on the successful continuous deposition of very thick (up to 700 nm) doped-CeO2 single buffer layers on biaxially textured Ni-5at%W substrates by PED. XRD patterns display complete orientation and very good texture quality of our samples (FWHM out-of plane values of ? 6°), over 20 cm length. Optical and electron microscopy show a dense and crack-free film surface and dielectric strength measurement confirms excellent insulating properties. Preliminary results indicate that the simplified single buffer layer structure could be a reliable solution for the reduction of HTS CC production costs.

Pulsed Electron Deposition (PED) of Single Buffer Layer for low-cost YBCO Coated Conductors

E Gilioli;F Bissoli;D Calestani;F Pattini;S Rampino;
2008

Abstract

The challenge for the commercialization of YBCO Coated Conductors (CC) is the development of a low cost manufacturing process to allow for a cheap, fast and continuous deposition of superconducting coatings with high electrical performance. We are currently investigating 2 ways to reduce the CC production costs: i) reducing the complexity of the CC architecture, by growing a single buffer layer based on doped CeO2, and ii) utilizing a new reel-to-reel apparatus for long length CC processing, equipped with a cheap and reliable deposition system (PED, Pulsed Electron Deposition). In this work we report on the successful continuous deposition of very thick (up to 700 nm) doped-CeO2 single buffer layers on biaxially textured Ni-5at%W substrates by PED. XRD patterns display complete orientation and very good texture quality of our samples (FWHM out-of plane values of ? 6°), over 20 cm length. Optical and electron microscopy show a dense and crack-free film surface and dielectric strength measurement confirms excellent insulating properties. Preliminary results indicate that the simplified single buffer layer structure could be a reliable solution for the reduction of HTS CC production costs.
2008
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/260611
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