A generalized auxiliary differential equation (ADE) finite-difference time-domain (FDTD) dispersive scheme is introduced for the rigorous simulation of wave propagation in metallic structures at optical frequencies, where material dispersion is described via an arbitrary number of Drude and critical point terms. The implementation of an efficient perfectly matched layer for the termination of suchmedia is also discussed and demonstrated. The model's validity is directly compared with both analytical and numerical results that employ known dispersion schemes, for the case of two benchmark examples, transmission through a thin metal film and scattering from a metallic nanocylinder. Furthermore, the accuracy of the proposed method is also demonstrated in the study of the optical properties of Ag and Au metal-insulator-metal waveguides, filters, and resonators, which also involve dielectrics whose material dispersion is described by the Sellmeier model.

A Unified FDTD/PML Scheme Based on Critical Points for Accurate Studies of Plasmonic Structures

2013

Abstract

A generalized auxiliary differential equation (ADE) finite-difference time-domain (FDTD) dispersive scheme is introduced for the rigorous simulation of wave propagation in metallic structures at optical frequencies, where material dispersion is described via an arbitrary number of Drude and critical point terms. The implementation of an efficient perfectly matched layer for the termination of suchmedia is also discussed and demonstrated. The model's validity is directly compared with both analytical and numerical results that employ known dispersion schemes, for the case of two benchmark examples, transmission through a thin metal film and scattering from a metallic nanocylinder. Furthermore, the accuracy of the proposed method is also demonstrated in the study of the optical properties of Ag and Au metal-insulator-metal waveguides, filters, and resonators, which also involve dielectrics whose material dispersion is described by the Sellmeier model.
2013
Istituto per la Microelettronica e Microsistemi - IMM
Auxiliary differential equations
Cauchy
critical points
finite-difference time-domain method
material dispersion
perfectly matched layers
plasmonic waveguides
scattering crosssection
Sellmeier.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/263004
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