We report the results of joint energy dispersive X-ray diffraction and reflectometry studies of the structural and morphological characteristics of double layer CoPt/Cr thin films, deposited by pulsed laser deposition at various temperatures (T-dep = 25-500 degrees C) on (100) MgO substrates. The observed characteristics were correlated to the magnetic properties investigated by SQUID measurements.
Structural, morphological and magnetic study of CoPt/Cr/MgO films by Energy Dispersive X-Ray Diffractometry and Reflectometry measurements
Paci B;Generosi A;Agostinelli E;Varvaro G
2004
Abstract
We report the results of joint energy dispersive X-ray diffraction and reflectometry studies of the structural and morphological characteristics of double layer CoPt/Cr thin films, deposited by pulsed laser deposition at various temperatures (T-dep = 25-500 degrees C) on (100) MgO substrates. The observed characteristics were correlated to the magnetic properties investigated by SQUID measurements.File in questo prodotto:
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