The polarization scan of both pumps in a noncollinear second-harmonic experiment is shown to be a powerful tool for identifying the different components of plane misalignment angles in a nonlinear crystal. Here, we report an optical axis misalignment as small as 1 degrees, in a 380 mu m thick 4H-SiC sample, by means of 130 fs pulsed laser of 830 nm wavelength. The optical axis misalignment is confirmed by the x-ray structural analysis. (C) 2013 Optical Society of America
Optical axis misalignment detection by noncollinear second-harmonic generation
Tasco V;Passaseo A;
2014
Abstract
The polarization scan of both pumps in a noncollinear second-harmonic experiment is shown to be a powerful tool for identifying the different components of plane misalignment angles in a nonlinear crystal. Here, we report an optical axis misalignment as small as 1 degrees, in a 380 mu m thick 4H-SiC sample, by means of 130 fs pulsed laser of 830 nm wavelength. The optical axis misalignment is confirmed by the x-ray structural analysis. (C) 2013 Optical Society of AmericaFile in questo prodotto:
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