On the basis of RF characteristics and measured smallsignal parameters, an equivalent circuit model was formulated and characterized for metal-semiconductor field effect transistors based on H-terminated polycrystalline diamond. Starting from on-wafer measurements, a bias-dependent transistor behavior representation was fully determined. Such an equivalent circuit model is the first important step to realize an RF IC based on diamond. © 2009 Wiley Periodicals, Inc.

Modeling of diamond field-effect transistors for RF IC development

Calvani P;
2009

Abstract

On the basis of RF characteristics and measured smallsignal parameters, an equivalent circuit model was formulated and characterized for metal-semiconductor field effect transistors based on H-terminated polycrystalline diamond. Starting from on-wafer measurements, a bias-dependent transistor behavior representation was fully determined. Such an equivalent circuit model is the first important step to realize an RF IC based on diamond. © 2009 Wiley Periodicals, Inc.
2009
Inglese
51
11
2783
2786
http://www.scopus.com/inward/record.url?eid=2-s2.0-70349092200&partnerID=q2rCbXpz
DC and RF performance
Device modeling
Device technology
Electrical characteristics
Semiconductor devices
Small-signal equivalent circuit
Wide band semiconductors
1
info:eu-repo/semantics/article
262
Pasciuto B.; Ciccognani W.; Limiti E.; Serino A.; Calvani P.; Corsaro A.; Conte G.; Rossi M.C.
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/270093
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