Resonant scattering of elliptically polarised soft X-rays has been used to investigate the magnetic properties of thin uncapped Ni layers grown on Cu(110). In our experiment, performed at room temperature, Ni is found to have no net magnetic moment in the surface plane up to 6 ML. Starting from 10 and up to 30 ML a magnetic signal is observed that can be reproduced by calculations which assume the bulk magnetic properties of Ni. Our results are compared to those of previous studies on Ni/Cu(001) layers. (C) 1999 Elsevier Science B.V. All rights reserved.

Soft X-ray resonant magnetic scattering from thin Ni layers on Cu(110)

Iacobucci S
1999

Abstract

Resonant scattering of elliptically polarised soft X-rays has been used to investigate the magnetic properties of thin uncapped Ni layers grown on Cu(110). In our experiment, performed at room temperature, Ni is found to have no net magnetic moment in the surface plane up to 6 ML. Starting from 10 and up to 30 ML a magnetic signal is observed that can be reproduced by calculations which assume the bulk magnetic properties of Ni. Our results are compared to those of previous studies on Ni/Cu(001) layers. (C) 1999 Elsevier Science B.V. All rights reserved.
1999
Inglese
442
3
349
356
8
Sì, ma tipo non specificato
copper
nickel
magnetic measurements
X-ray scattering
diffraction
and reflection
1
info:eu-repo/semantics/article
262
Sacchi, M ; Mirone, A ; Iacobucci, S
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/278864
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