The melt spun ribbons of ferromagnetic shape-memory alloy (FSMA) Ni53Mn24Ga23 have been prepared by rapid quenching. Thermomechanical properties have been studied by multi-point technique and perfect shape memory effect (SME) observed. The magnetic field effect on thermomechanical behavior was studied by placing multi-point press into Bitter magnet. A giant (1.2%) bending strain, due to magnetic field-induced martensitic transformation (magnetic-field-induced SME), has been observed at a constant temperature T=56 degrees C in a field of 6 T. At least 80% of martensitic transformation reversibly induced by the external field was observed experimentally. Submicron sized samples of the alloy with thicknesses down to 300 nm have been milled by focused ion beam (FIB) technique. The deformation behavior of these samples was studied by Omniprobe micromanipulator in the vacuum chamber of FIB device. The SME response was tested in situ by heating the samples with a semiconductor laser. Strong "two-way" SME was observed due to bending strains of the samples under study.
Shape Memory Effect in Microsized Samples of Rapidly Quenched Ferromagnetic Alloy Ni-Mn-Ga
Albertini F;Fabbrici S;
2012
Abstract
The melt spun ribbons of ferromagnetic shape-memory alloy (FSMA) Ni53Mn24Ga23 have been prepared by rapid quenching. Thermomechanical properties have been studied by multi-point technique and perfect shape memory effect (SME) observed. The magnetic field effect on thermomechanical behavior was studied by placing multi-point press into Bitter magnet. A giant (1.2%) bending strain, due to magnetic field-induced martensitic transformation (magnetic-field-induced SME), has been observed at a constant temperature T=56 degrees C in a field of 6 T. At least 80% of martensitic transformation reversibly induced by the external field was observed experimentally. Submicron sized samples of the alloy with thicknesses down to 300 nm have been milled by focused ion beam (FIB) technique. The deformation behavior of these samples was studied by Omniprobe micromanipulator in the vacuum chamber of FIB device. The SME response was tested in situ by heating the samples with a semiconductor laser. Strong "two-way" SME was observed due to bending strains of the samples under study.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
