Charge transients induced by optical pulses in CdTe detectors are used to investigate carrier dynamics and collection properties. Various features have been observed in the signals induced by optical excitation in the wavelength range 500nm - 1650nm, depending on the absorption, and the transport mechanism involved. A systematic comparison between charge transients recorded for irradiations through cathode and anode contacts, allows to point out the role of defects near the surface, instability effects, deep level transitions into the bulk, and finally internal photoelectric effects at the contacts.

Charge Transients by Variable Wavelength Optical Pulses in CdTe Nuclear Detectors

Cola Adriano;Farella Isabella;
2011

Abstract

Charge transients induced by optical pulses in CdTe detectors are used to investigate carrier dynamics and collection properties. Various features have been observed in the signals induced by optical excitation in the wavelength range 500nm - 1650nm, depending on the absorption, and the transport mechanism involved. A systematic comparison between charge transients recorded for irradiations through cathode and anode contacts, allows to point out the role of defects near the surface, instability effects, deep level transitions into the bulk, and finally internal photoelectric effects at the contacts.
2011
Inglese
2011 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC)
4604
4610
7
978-1-4673-0120-6
OCT 23-29, 2011
Valencia, SPAIN
3
none
Cola, Adriano; Farella, Isabella; Anni, Marco
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/285013
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