A detailed strain analysis of high resolution x-ray diffraction patterns taken from GaxIn1-xAs and AlyIn1-yAs layers grown lattice matched on (001) InP substrates shows the existence of distinct interface regions. Our dynamical diffraction model allows us to detect buried interface layers with submonolayer resolution and differences in composition of less than 1% from the rest of the epilayer. Comparison between experimental and theoretical rocking curves reveals that the interface region between epilayer and substrate comprises 2 monolayers InAs plus GaxIn1-xAs (or AlyIn1-yAs) interlayer with different group III element ratios.
ANALYSIS OF EPITAXIAL GAXIN1-XAS/INP AND ALYIN1-YAS/INP INTERFACE REGION BY HIGH-RESOLUTION X-RAY-DIFFRACTION
GIANNINI C;
1993
Abstract
A detailed strain analysis of high resolution x-ray diffraction patterns taken from GaxIn1-xAs and AlyIn1-yAs layers grown lattice matched on (001) InP substrates shows the existence of distinct interface regions. Our dynamical diffraction model allows us to detect buried interface layers with submonolayer resolution and differences in composition of less than 1% from the rest of the epilayer. Comparison between experimental and theoretical rocking curves reveals that the interface region between epilayer and substrate comprises 2 monolayers InAs plus GaxIn1-xAs (or AlyIn1-yAs) interlayer with different group III element ratios.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
