We describe a source of noise in thin-junction silicon single-photon avalanche diode arising after strong illumination either during the ON (voltage above breakdown) or the OFF (voltage below breakdown) time. It increases the background noise with respect to primary dark count rate similarly to the afterpulsing process, but it is not related to a previous detector ignition. The amount of noise is linearly dependent on the power of light impinging on the detector and time constants are independent of the electric field. This phenomenon is the main limiting factor for the dynamic-range during time-gated measurements in condition of strong illumination. © 2012 American Institute of Physics.

Afterpulse-like noise limits dynamic range in time-gated applications of thin-junction silicon single-photon avalanche diode

Pifferi Antonio;Cubeddu Rinaldo;
2012

Abstract

We describe a source of noise in thin-junction silicon single-photon avalanche diode arising after strong illumination either during the ON (voltage above breakdown) or the OFF (voltage below breakdown) time. It increases the background noise with respect to primary dark count rate similarly to the afterpulsing process, but it is not related to a previous detector ignition. The amount of noise is linearly dependent on the power of light impinging on the detector and time constants are independent of the electric field. This phenomenon is the main limiting factor for the dynamic-range during time-gated measurements in condition of strong illumination. © 2012 American Institute of Physics.
2012
Istituto di fotonica e nanotecnologie - IFN
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/291207
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 34
  • ???jsp.display-item.citation.isi??? ND
social impact