We report a new interferometric technique for measuring the ordinary and extraordinary, refractive indices of uniaxial crystals. The technique is based on the measurement of the rotation-dependent phase changes of the optical path length in crystal plates. Accurate measurement of the phase shift as a function of the rotation of the sample is achieved by using a fast-Fourier-transform based fringe analysis method for phase retrieval. The principle of the method is discussed and measurements of the ordinary and extraordinary refractive indices of a lithium niobate crystal are reported.

Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals

De Nicola S;Ferraro P;Finizio A;De Natale P;Grilli S;Pierattini G
2003

Abstract

We report a new interferometric technique for measuring the ordinary and extraordinary, refractive indices of uniaxial crystals. The technique is based on the measurement of the rotation-dependent phase changes of the optical path length in crystal plates. Accurate measurement of the phase shift as a function of the rotation of the sample is achieved by using a fast-Fourier-transform based fringe analysis method for phase retrieval. The principle of the method is discussed and measurements of the ordinary and extraordinary refractive indices of a lithium niobate crystal are reported.
2003
Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" - ISASI
Istituto Nazionale di Ottica - INO
Inglese
4th International Conference on Photonics, Devices and Systems
5036
594
599
6
0-8194-4837-0
MAY 26-29, 2002
PRAGUE, CZECH REPUBLIC
6
none
De Nicola, S; Ferraro, P; Finizio, A; De Natale, P; Grilli, S; Pierattini, G
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/294291
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