The adsorption of a bi-functional organic molecule like phenol on Si(1 00)2 · 1 has been investigated by synchrotron radiation-induced photoemission in the valence band, Si 2p, C 1s and O 1s core-level regions. Experiments have been carried out as a function of phenol exposure at room temperature. Phenol adsorbs on Si(1 00)2 · 1 through a dissociative mechanism at room temperature, interacting with the surface by its alcoholic functionality. The line-shape analysis of Si 2p spectra indicates the formation of Si-O and Si-H bonds, as a consequence of the cleavage of the C-O-H bond and the binding of the fragments (CO- group and H atom) to the Si(1 00)2 · 1 surface dimers. The progressive quenching of the silicon surface dimer atoms and the corresponding intensity increase of the Si-OC and Si-H components have been observed as a function of phenol exposure. The presence of the phenoxide (CO-) group on the silicon surface has been evidenced also by the C 1s spectrum, consisting of two components in a 1:5 intensity ratio, energy splitted by 1.5 eV, which can be assigned to carbon atom linked to oxygen (C-O group) and carbon atoms of the aromatic ring, respectively.
A high resolution photoemission study of phenol adsorption on Si (100) 2x1
MP Casaletto;
2005
Abstract
The adsorption of a bi-functional organic molecule like phenol on Si(1 00)2 · 1 has been investigated by synchrotron radiation-induced photoemission in the valence band, Si 2p, C 1s and O 1s core-level regions. Experiments have been carried out as a function of phenol exposure at room temperature. Phenol adsorbs on Si(1 00)2 · 1 through a dissociative mechanism at room temperature, interacting with the surface by its alcoholic functionality. The line-shape analysis of Si 2p spectra indicates the formation of Si-O and Si-H bonds, as a consequence of the cleavage of the C-O-H bond and the binding of the fragments (CO- group and H atom) to the Si(1 00)2 · 1 surface dimers. The progressive quenching of the silicon surface dimer atoms and the corresponding intensity increase of the Si-OC and Si-H components have been observed as a function of phenol exposure. The presence of the phenoxide (CO-) group on the silicon surface has been evidenced also by the C 1s spectrum, consisting of two components in a 1:5 intensity ratio, energy splitted by 1.5 eV, which can be assigned to carbon atom linked to oxygen (C-O group) and carbon atoms of the aromatic ring, respectively.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.