We have measured the lifetimes of P-1(e) (n=9-12) doubly excited states in static electric fields (1-6 kV/cm) by observing the decay of the fluorescence signal as a function of time. The effects of the field on these helium states below the second ionization threshold are twofold: their excitation becomes possible due to the Stark mixing with the optically allowed P-1(o) series, and their lifetime is strongly modified by the opening of the autoionization channel, not accessible in zero field. Although the electric field represents only a tiny perturbation of the atomic potential, a substantial shortening of the lifetimes below 100 ps is observed. This is the simplest quantum system where the ratio of autoionization to fluorescence decay probability can be effectively controlled by an electric field of moderate strength.

Effect of electric fields on the decay branching ratio of Pe1 doubly excited states in helium measured by time-resolved fluorescence

M Alagia;
2006

Abstract

We have measured the lifetimes of P-1(e) (n=9-12) doubly excited states in static electric fields (1-6 kV/cm) by observing the decay of the fluorescence signal as a function of time. The effects of the field on these helium states below the second ionization threshold are twofold: their excitation becomes possible due to the Stark mixing with the optically allowed P-1(o) series, and their lifetime is strongly modified by the opening of the autoionization channel, not accessible in zero field. Although the electric field represents only a tiny perturbation of the atomic potential, a substantial shortening of the lifetimes below 100 ps is observed. This is the simplest quantum system where the ratio of autoionization to fluorescence decay probability can be effectively controlled by an electric field of moderate strength.
2006
Istituto per lo Studio dei Materiali Nanostrutturati - ISMN
INFM
Istituto Officina dei Materiali - IOM -
RADIATIVE DECAY; IONIZATION THRESHOLD
AUTOIONIZING STATES
GROUND-STATE
SPECTROSCOPY
EXCITATION; N=2; HE
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/29853
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact