A method is presented to determine the helix orientation starting from X ray diffraction data. Our method is based on the periodicity properties of alpha helix and on the analysis of the properties of the corresponding Patterson function, obtained directly from raw crystallographic intensities. Knowledge of helix orientation is a useful information within the structure solution process of proteins. © 2011 IEEE.
Automatic identification of alpha-helices in X-ray diffraction patterns
Mazzone Annamaria;Nico Giovanni;Caliandro Rocco
2011
Abstract
A method is presented to determine the helix orientation starting from X ray diffraction data. Our method is based on the periodicity properties of alpha helix and on the analysis of the properties of the corresponding Patterson function, obtained directly from raw crystallographic intensities. Knowledge of helix orientation is a useful information within the structure solution process of proteins. © 2011 IEEE.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
