A microwave scanner operating in the frequency band 1 - 10 GHz is described. The system is based on an evanescent-field resonant sensor, allowing to obtain maps of dielectric contrast through a measurement of resonance frequency (F maps) and quality factor (Q maps). Laboratory experiments are presented with results validating the measurement system.

A Microwave Scanner for Sub-surface Diagnostics of Artefacts

R Olmi;F Micheletti;S Priori;C Riminesi;
2015

Abstract

A microwave scanner operating in the frequency band 1 - 10 GHz is described. The system is based on an evanescent-field resonant sensor, allowing to obtain maps of dielectric contrast through a measurement of resonance frequency (F maps) and quality factor (Q maps). Laboratory experiments are presented with results validating the measurement system.
2015
scanner; microwave microscopy; dielectrometry; diagnostics
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/302609
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