We performed pulsed measurements on organic transistors presenting four different active materials. All the devices show a strong correlation between drain-source current and the pulse width. We attributed this phenomenon to the long time needed for channel formation and depletion. These transient effects may have a severe impact on device characterization and application development.

On the Pulsed and Transient characterization of Organic Field-Effect Transistors

Toffanin S;Quiroga SD;Benvenuti E;Natali M;Muccini M;
2015

Abstract

We performed pulsed measurements on organic transistors presenting four different active materials. All the devices show a strong correlation between drain-source current and the pulse width. We attributed this phenomenon to the long time needed for channel formation and depletion. These transient effects may have a severe impact on device characterization and application development.
2015
Istituto per lo Studio dei Materiali Nanostrutturati - ISMN
Charge carrier processes;Current measurement;Logic gates;OFETs;Pulse measurements;Semiconductor device measurement;Transient analysis;Organic Semiconductors;Organic thin-film transistor;characterization techniques;current transients;pulse measurements
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/303883
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